Annals of Occupational Hygiene Advance Access originally published online on January 13, 2005
Annals of Occupational Hygiene 2005 49(4):351-358; doi:10.1093/annhyg/meh095
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Original Article |
Comparison of Quartz Standards for X-ray Diffraction Analysis: HSE A9950 (Sikron F600) and NIST SRM 1878
Health and Safety Laboratory, Harpur Hill, Buxton, Derbyshire SK17 9JN, UK
* Tel: 01298 218555; fax: 01298 218571; e-mail: jim.chisholm{at}hsl.gov.uk
ABSTRACT
A further comparison of the Health and Safety Executive (HSE) standard quartz, A9950 (Sikron F600), and the National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 1878, standard respirable 
-quartz, has been carried out for the four principal diffraction peaks. In the earlier comparison by Jeyaratnam and Nagar (1993, Ann Occup Hyg; 37: 167–79), the standards were both treated in ways which might change the particle size distribution and therefore the proportion of crystalline quartz. The two standards have now been compared in the most direct way possible with the minimum of sample treatment. There are no significant differences in the diffraction peak positions for the two standards. Nor do the peak area intensities differ significantly. The peak height intensities are consistently and significantly higher for Sikron F600 than for NIST SRM 1878. The particle size broadening of the diffraction peaks is evidently greater for NIST 1878, whose mass median diameter is quoted as 1.6 µm against 2.6 µm for Sikron F600. Taking the certified reference value for SRM 1878 as 95.5 ± 1.1% crystalline quartz, the HSE standard A9950 (Sikron F600) contains 96.3 ± 1.4% crystalline quartz based on a comparison of peak area intensities. On the same basis but using peak height intensities, the nominal crystalline quartz content of A9950 (Sikron F600) is 101.2 ± 1.8%. Results obtained by comparison of quartz standards may not be generally applicable because of the effect of sample treatment on particle size and crystalline quartz content.
Keywords: crystalline silica • quartz • X-ray diffraction
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